New EDX Detector from Ametek

New EDX Detector from Ametek

The game changing advancements in the Octane Elite EDS System with Octane Elite Silicon Drift Detector (SDDs) takes Energy Dispersive Spectroscopy (EDS) analysis to the next level. This system includes detectors which incorporate a silicon nitride (Si3N4) window, offering remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite detectors also use technology which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.

Octane Elite Silicon Drift Detectors (SDDs)

The Octane Elite SDDs incorporate a silicon nitride (Si3N4) window, high speed electronics and a motorized slide. They can be combined with one of EDAX’s Electron Backscatter Diffraction (EBSD) cameras and/or Wavelength Dispersive Spectrometry (WDS) detectors as part of the Pegasus EDS-EBSD Analysis System or Trident EDS-EBSD-WDS Analysis System for a complete materials characterization solution. For more information, please visit the Pegasus Analysis Systemand Trident Analysis System pages.

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