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Nano Imaging Lab
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AFM
Bruker/JPK NanoWizard 4
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Bruker/JPK NanoWizard 4 (AFM – Atomic Force Microscopy)
Technical specifications
Maximum sample size up to 14 cm in diameter and 18 mm thickness
Images up to 100 µm in X & Y and 15 µm in Z-height
Gas- and liquid cell (HyperDrive™ fluid imaging for high resolution AFM)
Temperature control from 15°C to 60°C
QI-Mode (High-resolution quantitative imaging)
Compatibel with Zeiss inverted microscope
Modes
Standard imaging modes: Contact Mode, Tapping Mode
Phase Imaging Mode
Lateral Force Mode
Magnetic Force Microscopy (MFM)
Electrostatic Force Microscopy (EFM)
Force Spectroscopy (adhesion, elasticity and Youngs Modulus)
Force Modulation
Kelvin Probe Microscopy (KPFM)
Conductive AFM (CAFM)
Piezoresponse Force Microscopy (PFM)
Nanomanipulation and nanolithography
Typical applications
Surface roughness measurements
Step height and characterization of surfaces
Force spectroscopy of cell structures and biological membranes
Viscoelastic mapping of mechanical properties
Location
Pharmazentrum, Lab U1011
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