• maximum sample diameter up to 15 cm in diameter
• 100 µm in X & Y and 20 µm in Z (piezo scanner)
• 840 nm SLD readout light source, 785 nm photothermal excitation laser for optional photothermal cantilever excitation
• automatic, motorized approach over 10 mm
• automatic laser and detector alignment
• operation in air and liquid
• XY drive resolution: 0.4 pm
• Z drive resolution: 0.06 pm
• Z measurement noise level (dynamic): typ. 20 pm, max. 35 pm (RMS, dynamic mode in air) in a suitable environment
• detector bandwidth: DC - >6 MHz
• operating temperature: 15-40°C
• humidity: up to 75% r.h.

Modes

• Standard imaging modes: Contact mode, Dynamic mode
• WaveMode
• Phase contrast, Friction mode
• Magnetic Force Microscopy (MFM)
• Electrostatic Force Microscopy (EFM)
• Kelvin Probe Force Microscopy (KPFM)
• Piezoresponse Force Microscopy (PFM)
• Spectroscopy modes
• Lithography and manipulation mode

Typical applications

• Surface roughness measurements
• Step height and characterization of surfaces
• Force spectroscopy of cell structures and biological membranes
• Viscoelastic mapping of mechanical properties

Location

Department of Physics, Lab 0.17