Bruker Dimension 3100 (AFM – Atomic Force Microscopy)
Technical specifications
- Maximum sample size up to 20 cm in diameter and 12 mm in thickness
- Images up to 90 µm in X & Y and 6 µm in Z-height
- Liquid cell
Modes
- Contact Mode, Tapping Mode
- Lateral Force Mode
- Phase Imaging Mode
- Magnetic Force Microscopy (MFM)
- Electrostatic Force Microscopy (EFM)
- Force Volume
Typical applications
- Characterization of surface roughness
- Step height and topography
Location
Physics Department, Lab 0.17