Bruker/JPK NanoWizard 4 (AFM – Atomic Force Microscopy)
Technical specifications
- Maximum sample size up to 14 cm in diameter and 18 mm thickness
- Images up to 100 µm in X & Y and 15 µm in Z-height
- Gas- and liquid cell (HyperDrive™ fluid imaging for high resolution AFM)
- Temperature control from 15°C to 60°C
- QI-Mode (High-resolution quantitative imaging)
- Compatibel with Zeiss inverted microscope
Modes
- Standard imaging modes: Contact Mode, Tapping Mode
- Phase Imaging Mode
- Lateral Force Mode
- Magnetic Force Microscopy (MFM)
- Electrostatic Force Microscopy (EFM)
- Force Spectroscopy (adhesion, elasticity and Youngs Modulus)
- Force Modulation
- Kelvin Probe Microscopy (KPFM)
- Conductive AFM (CAFM)
- Piezoresponse Force Microscopy (PFM)
- Nanomanipulation and nanolithography
Typical applications
- Surface roughness measurements
- Step height and characterization of surfaces
- Force spectroscopy of cell structures and biological membranes
- Viscoelastic mapping of mechanical properties
Location
Pharmazentrum, Lab U1011