3D Laserscanning microscope (reflexion type)

Technical specifications

3D Laserscanning-Mikroskop (Reflexion)
  • 16-bit confocal 3D laser scanning microscope
  • Control unit: VK-X1000
  • Microscope head: VK-X1100
  • Motorized stage
  • Wavelength of the violet semiconductor laser: 404 nm
  • Magnification: 42x to 28’800x
  • Resolution of the z-axis: 0.5 nm
  • WIDE scan to expand the image field at high magnification
  • VK-X stitching software for measuring large areas with high resolution
  • No sample preparation or vacuum necessary

Typical applications

Fast imaging of the measuring objects in real colors (for matt, reflective and transparent surfaces) Profile, roughness, volume, surface and layer thickness measurements Automatic evaluation and comparison functions Stitching and roughness programs (according to ISO)

Imaging options

High resolution CMOS color image 16-bit laser color confocal image Confocal pinhole optics with ND filter (focus variation) 3D illustration with height scale C-Laser DIC image (differential interference contrast)


Physics Department, Lab 0.17