• 16-bit confocal 3D laser scanning microscope
• Control unit: VK-X1000
• Microscope head: VK-X1100
• Motorized stage
• Wavelength of the violet semiconductor laser: 404 nm
• Magnification: 42x to 28’800x
• Resolution of the z-axis: 0.5 nm
• WIDE scan to expand the image field at high magnification
• VK-X stitching software for measuring large areas with high resolution
• No sample preparation or vacuum necessary

Imaging options

• High resolution CMOS color image
• 16-bit laser color confocal image
• Confocal pinhole optics with ND filter (focus variation)
• 3D illustration with height scale
• C-Laser DIC image (differential interference contrast)

Typical applications

• Fast imaging of the measuring objects in real colors (for matt, reflective and transparent surfaces)
• Profile, roughness, volume, surface and layer thickness measurements
• Automatic evaluation and comparison functions
• Stitching and roughness programs (according to ISO)

Location

Physics Department, Lab 0.17