SEM – Zeiss GeminiSEM 450
Technical specifications
![REM – Zeiss GeminiSEM 450](/fileadmin/_processed_/9/4/csm_zeiss-geminisem-450_ov-scaled_26b610ca5c.jpg?1666623567)
- Field emission column (FE-SEM Schottky)
- Resolution electron beam:
- 0.7 nm @ 15 kV
- 1.1 nm @ 500 V and 1 kV
- Magnification: 12x – 2’000’000x
Detectors and micro analysis
- SE InLens detector
- EsB detector, Energy-selective Backscattered detector for SE and BSE detection
- SE2 detector (Everhart-Thornley)
- VPSE detector, Variable Presssure Secondary Electron detector for imaging of non-conducting specimens
- aSTEM detector
- aBSD detector, annular BackScattered electron Detector for high efficiency and angle selective material characterization
- Octane Elite detector for light element detection and low kV microanalysis combined with Velocity Pro EDAX’s Electron BackScatter Diffraction (EBSD) camera
- characterization of Electron Backscatter Diffraction (EBSD) patterns (crystal orientation) within the APEX software platform
Typical applications
- Imaging and material analysis
- Crystallographic determination on the nanoscale
Location
Pharmazentrum, U1002