Technical specifications

STEM – Jeol JEM-F200 cFEG
  • Cold field emission gun
  • 20 to 200 kV acceleration voltage
  • Resolution:
    • TEM, point to point: 0.19 nm
    • TEM, lattice image: 0.10 nm
    • STEM-HAADF: 0.14 nm
  • Magnification TEM from x 20 to  x 2.0 M; STEM from x 200 to x 150 M
  • Energy Dispersive X-Ray Spectrometer (EDS)
  • Sample size: TEM grids of 3 x 3 mm

Imaging modes

  • HAADF STEM (High-angle annular dark-field scanning transmission electron microscopy)
  • Bright-field (BF) & dark-field (DF) TEM and STEM, as well as analysis from various types of detectors
  • 3D-EDS tomography: reconstruction method of three-dimensional internal structures through computer image processing of many projection images, which are acquired from sequential tilt-series images of a specimen

Typical applications

  • Characterization of nanoparticles, thin films and nanostructured material
  • Atomic resolution and electron diffraction images (transmission Kikuchi patterns)


Pharmazentrum, PZ U1097