• Cold field emission gun
• 20 to 200 kV acceleration voltage
• Resolution:
  • TEM, point to point: 0.19 nm
  • TEM, lattice image: 0.10 nm
  • STEM-HAADF: 0.14 nm
• Magnification TEM from x 20 to  x 2.0 M; STEM from x 200 to x 150 M
• Energy Dispersive X-Ray Spectrometer (EDS)
• Sample size: TEM grids of 3 x 3 mm

Imaging modes

• HAADF STEM (High-angle annular dark-field scanning transmission electron microscopy)
• Bright-field (BF) & dark-field (DF) TEM and STEM, as well as analysis from various types of detectors
• 3D-EDS tomography: reconstruction method of three-dimensional internal structures through computer image processing of many projection images, which are acquired from sequential tilt-series images of a specimen

Typical applications

• Characterization of nanoparticles, thin films and nanostructured material
• Atomic resolution and electron diffraction images (transmission Kikuchi patterns)

Location

Pharmazentrum, PZ U1097